[PATCH 5/8] ntdll/tests: Use MEM_TOP_DOWN parameter to consistently fail zero_bits tests

Huw Davies huw at codeweavers.com
Tue Aug 13 04:45:38 CDT 2019

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Signed-off-by: Huw Davies <huw at codeweavers.com>

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Next message: [PATCH 6/8] ntdll/tests: Update zero_bits > 31 test case to validate bitmask behavior
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