[PATCH v3 09/10] ntdll/tests: Use MEM_TOP_DOWN parameter to consistently fail zero_bits tests

[Marvin]

Hi,

While running your changed tests, I think I found new failures.
Being a bot and all I'm not very good at pattern recognition, so I might be
wrong, but could you please double-check?

Full results can be found at:
https://testbot.winehq.org/JobDetails.pl?Key=53844

Your paranoid android.


=== build (build log) ===

error: patch failed: dlls/ntdll/tests/virtual.c:28
error: patch failed: dlls/ntdll/tests/virtual.c:248
error: patch failed: dlls/ntdll/tests/virtual.c:321
error: patch failed: dlls/ntdll/tests/virtual.c:27
error: patch failed: dlls/ntdll/tests/virtual.c:176
Task: Patch failed to apply

=== debian9 (build log) ===

error: patch failed: dlls/ntdll/tests/virtual.c:28
error: patch failed: dlls/ntdll/tests/virtual.c:248
error: patch failed: dlls/ntdll/tests/virtual.c:321
error: patch failed: dlls/ntdll/tests/virtual.c:27
error: patch failed: dlls/ntdll/tests/virtual.c:176
Task: Patch failed to apply

=== debian9 (build log) ===

error: patch failed: dlls/ntdll/tests/virtual.c:28
error: patch failed: dlls/ntdll/tests/virtual.c:248
error: patch failed: dlls/ntdll/tests/virtual.c:321
error: patch failed: dlls/ntdll/tests/virtual.c:27
error: patch failed: dlls/ntdll/tests/virtual.c:176
Task: Patch failed to apply