[PATCH 3/4] dinput8/tests: Make overlapped format test more robust.

Marvin testbot at winehq.org
Fri Jul 23 10:52:03 CDT 2021


While running your changed tests, I think I found new failures.
Being a bot and all I'm not very good at pattern recognition, so I might be
wrong, but could you please double-check?

Full results can be found at:

Your paranoid android.

=== w7u_2qxl (32 bit report) ===

device.c:866: Test failed: Expected 1 element, received 0
device.c:870: Test failed: Expected DIK_SPACE key state down
device.c:878: Test failed: Expected 1 element, received 0
device.c:893: Test failed: Expected key 0 state down

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