[PATCH v3 5/5] ntoskrnl.exe/tests: Remove unnecessary store and certs handles.

[Zebediah Figura]

On 9/6/21 4:23 PM, Rémi Bernon wrote:
> On 9/6/21 11:15 PM, Zebediah Figura wrote:
>> On 9/6/21 5:27 AM, Rémi Bernon wrote:
>>> Signed-off-by: Rémi Bernon <rbernon at codeweavers.com>
>>> ---
>>>    dlls/ntoskrnl.exe/tests/ntoskrnl.c | 133 +++++++++++++++--------------
>>>    1 file changed, 71 insertions(+), 62 deletions(-)
>>>
>>
>> I like 3/5 and 4/5, but this seems like less obviously an improvement.
>> Is there a motivation for this besides getting rid of the
>> testsign_context structure?
>>
> 
> Mostly to reduce the required state for the functions, and get rid of
> the structure yes.
> 
> I'm planning on copying the code to have a driver based dinput test
> case, and I'm already not very happy with the code duplication, I wanted
> to not duplicate the structure if we could do without it.
> 
> It's not very important though, the dinput code will probably have small
> differences.
> 

I tried to design the testsign_* stuff to be independent and portable, 
not least because I have ancient tests written for setupapi that I never 
finished or submitted. I don't see how this patch helps with 
portability, though...?